| Motor de Búsqueda de Datasheet de Componentes Electrónicos |
|
LAN8804/ZMXC1 Datasheet(PDF) 57 Page - Microchip Technology |
|
|
|||||||||||||||||||||||||||||
LAN8804/ZMXC1 Datasheet(HTML) 57 Page - Microchip Technology |
|
57 / 91 page ![]() LAN8804 © 2024 Microchip Technology Inc. and its subsidiaries DS00003591G-page 57 The device also provides a RESET_N input pin. This pin must adhere to the timing requirements detailed in Section 6.6.2, "Power Sequence Timing" and Section 6.6.3, "Reset Pin Configuration Strap Timing". Release from reset is based on the RESET_N input pin transitioning from low to high. 5.20.4 POWER ON READY (POR) WITH OVER/UNDER VOLTAGE PROTECTION POR monitors three voltages (Refer to Table 6-14 for the exact specification): • +1.1V Analog Power Supply (on VDDAL_x) set for ~0.8V (typical) - it is assumed that VDDCORE and VDDAL_x are externally connected, therefore VDD is indirectly monitored. • +2.5 / 3.3V Analog Power Supply (on VDDAH_x) set for ~2.1V (typical) • Variable I/O Power Supply (on VDDIO) set for ~1.5V (typical) The POR circuits have a “dead zone” between bottom range of valid operational voltage and where POR trips (e.g., - 15%/20%). The Over/Under Voltage Protection enables tightening this range to just under the bottom of the supply range. 5.21 JTAG An IEEE 1149.1 compliant TAP Controller supports boundary scan and various test modes. The device includes an integrated JTAG boundary-scan test port for board-level testing. The interface consists of four pins ( TDO, TDI, TCK and TMS) and includes a state machine, data register array and an instruction register. The JTAG pins are described in Table 3-6. The JTAG interface conforms to the IEEE Standard 1149.1 - 2001 Standard Test Access Port (TAP) and Boundary-Scan Architecture. All input and output data is synchronous to the TCK test clock input. TAP input signals TMS and TDI are clocked into the test logic on the rising edge of TCK, while the output signal TDO is clocked on the falling edge. JTAG pins are multiplexed with the GPIO pins. The JTAG functionality is selected when the TESTMODE pin is asserted. The implemented JTAG instructions and their op codes are shown in Table 5-12. JTAG timing information is provided in Section 6.6.6, "JTAG Timing". TABLE 5-12: JTAG OP CODES INSTRUCTION OP CODE CLAMP 4’b0000 EXTEST 4’b0001 (RESERVED) 4’b0010 (RESERVED) 4’b0011 INTEST 4’b0100 SAMPLE_PRELOAD 4’b0101 HIGHZ 4’b0110 HOST-IJTAG ACCESS 4’b0111 ID CODE 4’b1000 BYPASS 4’b1001 to 4’b1111 Note: The JTAG device ID is 00341445h. Note: All digital I/O pins support IEEE 1149.1 operation. Analog pins do not support IEEE 1149.1 operation. |
|
Enlace URL |
| ¿ALLDATASHEET es útil para Ud.? [ DONATE ] |
Todo acerca de Alldatasheet | Publicidad | Contáctenos | Política de Privacidad | Enlace a la hoja de datos | Intercambio de Enlaces | Lista de Fabricantes All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |