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SPC560D40L1 Datasheet(PDF) 50 Page - STMicroelectronics

No. de pieza SPC560D40L1
Descripción Electrónicos  32-bit MCU family built on the Power Architecture for automotive body electronics applications
PDF  90 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC560D40L1 Datasheet(HTML) 50 Page - STMicroelectronics

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Electrical characteristics
SPC560D30x, SPC56040Dx
50/90
Doc ID 16315 Rev 7
t32Kpperase CC C 32 KB block preprogram and erase time
400
600
5000
ms
t128Kpperase CC C 128 KB block preprogram and erase time
800
1300
7500
ms
tesus
CC C Erase suspend latency
30
30
µs
1.
Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to change
pending device characterization.
2.
Initial factory condition: < 100 program/erase cycles, 25 °C, typical supply voltage.
3.
The maximum program and erase times occur after the specified number of program/erase cycles. These maximum values
are characterized but not guaranteed.
4.
Actual hardware programming times. This does not include software overhead.
Table 27.
Program and erase specifications (code flash)
Symbol
C
Parameter
Value
Unit
Min
Typ(1)
Initial
max(2)
Max(3)
Table 28.
Program and erase specifications (data flash)
Symbol
C
Parameter
Value
Unit
Min
Typ(1)
Initial
max(2)
Max(3)
tswprogram
CC C Single word (32 bits) program time(4)
30
70
300
µs
t16Kpperase CC C 16 KB block preprogram and erase time
700
800
1500
ms
tBank_D
CC C 64 KB block preprogram and erase time
1900
2300
4800
ms
1.
Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to change
pending device characterization.
2.
Initial factory condition: < 100 program/erase cycles, 25 °C, typical supply voltage.
3.
The maximum program and erase times occur after the specified number of program/erase cycles. These maximum values
are characterized but not guaranteed.
4.
Actual hardware programming times. This does not include software overhead.
Table 29.
Flash module life
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
P/E
CC C
Number of program/erase
cycles per block over the
operating temperature range
(TJ)
16 KB blocks
100000
cycles
32 KB blocks
10000
100000
cycles
128 KB blocks
1000
100000
cycles
Retention CC C
Minimum data retention at 85
°C average ambient
temperature(1)
Blocks with
0–1000 P/E cycles
20
years
Blocks with
1001–10000 P/E cycles
10
Blocks with
10001–100000 P/E cycles
5—
1.
Ambient temperature averaged over application duration. It is recommended not to exceed the product operating
temperature range.



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