| Motor de Búsqueda de Datasheet de Componentes Electrónicos |
|
MPC5634MF0MMGA6 Datasheet(PDF) 63 Page - Freescale Semiconductor, Inc |
|
|
|||||||||||||||||||||||||||||
MPC5634MF0MMGA6 Datasheet(HTML) 63 Page - Freescale Semiconductor, Inc |
|
63 / 118 page ![]() Electrical characteristics MPC5634M Microcontroller Data Sheet, Rev. 4 Preliminary—Subject to Change Without Notice Freescale Semiconductor 63 To determine the junction temperature of the device in the application on a prototype board, use the thermal characterization parameter ( ΨJT) to determine the junction temperature by measuring the temperature at the top center of the package case using the following equation: TJ = TT + (ΨJT x PD) Eqn. 4 where: TT = thermocouple temperature on top of the package (oC) ΨJT = thermal characterization parameter (oC/W) PD = power dissipation in the package (W) The thermal characterization parameter is measured in compliance with the JESD51-2 specification using a 40-gauge type T thermocouple epoxied to the top center of the package case. Position the thermocouple so that the thermocouple junction rests on the package. Place a small amount of epoxy on the thermocouple junction and approximately 1 mm of wire extending from the junction. Place the thermocouple wire flat against the package case to avoid measurement errors caused by the cooling effects of the thermocouple wire. References: Semiconductor Equipment and Materials International 3081 Zanker Road San Jose, CA 95134 USA (408) 943-6900 MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering Documents at 800-854-7179 or 303-397-7956. JEDEC specifications are available on the web at http://www.jedec.org. • C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54. • G. Kromann, S. Shidore, and S. Addison, “Thermal Modeling of a PBGA for Air-Cooled Applications”, Electronic Packaging and Production, pp. 53-58, March 1998. • B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220. |
|
Enlace URL |
| ¿ALLDATASHEET es útil para Ud.? [ DONATE ] |
Todo acerca de Alldatasheet | Publicidad | Contáctenos | Política de Privacidad | Enlace a la hoja de datos | Intercambio de Enlaces | Lista de Fabricantes All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |