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STM32F334X4 Datasheet(PDF) 20 Page - STMicroelectronics |
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STM32F334X4 Datasheet(HTML) 20 Page - STMicroelectronics |
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20 / 115 page ![]() Functional overview STM32F334x4 STM32F334x6 STM32F334x8 20/115 DocID025409 Rev 5 independently. A pending register maintains the status of the interrupt requests. The EXTI can detect an external line with a pulse width shorter than the internal clock period. Up to 51 GPIOs can be connected to the 16 external interrupt lines. 3.10 Fast analog-to-digital converter (ADC) Two 5 MSPS fast analog-to-digital converters, with selectable resolution between 12 and 6 bit, are embedded in the STM32F334x4/6/8 family devices. The ADCs have up to 21 external channels. Some of the external channels are shared between ADC1 and ADC2, performing conversions in single-shot or scan modes. The channels can be configured to be either single-ended input or differential input. In scan mode, automatic conversion is performed on a selected group of analog inputs. The ADCs also have internal channels: temperature sensor connected to ADC1 channel 16, VBAT/2 connected to ADC1 channel 17, voltage reference VREFINT connected to both ADC1 and ADC2 channel 18 and VOPAMP2 connected to ADC2 channel 17. Additional logic functions embedded in the ADC interface allow: • Simultaneous sample and hold • Interleaved sample and hold • Single-shunt phase current reading techniques. Three analog watchdogs are available per ADC. The ADC can be served by the DMA controller. The analog watchdog feature allows very precise monitoring of the converted voltage of one, some or all selected channels. An interrupt is generated when the converted voltage is outside the programmed thresholds. The events generated by the general-purpose timers (TIM2, TIM3, TIM6, TIM15), the advanced-control timer (TIM1) and the High-resolution timer (HRTIM1) can be internally connected to the ADC start trigger and injection trigger, respectively, to allow the application to synchronize A/D conversion and timers. 3.10.1 Temperature sensor The temperature sensor (TS) generates a voltage VSENSE that varies linearly with temperature. The temperature sensor is internally connected to the ADC1_IN16 input channel which is used to convert the sensor output voltage into a digital value. The sensor provides good linearity but it has to be calibrated to obtain good overall accuracy of the temperature measurement. As the offset of the temperature sensor varies from chip to chip due to process variation, the uncalibrated internal temperature sensor is suitable for applications that detect temperature changes only. To improve the accuracy of the temperature sensor measurement, each device is individually factory-calibrated by ST. The temperature sensor factory calibration data are stored by ST in the system memory area, accessible in read-only mode. 3.10.2 Internal voltage reference (VREFINT) The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the ADC and Comparators. VREFINT is internally connected to the ADC1_IN18 and ADC2_IN18 |
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