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STM32F334X4 Datasheet(PDF) 100 Page - STMicroelectronics

No. de pieza STM32F334X4
Descripción Electrónicos  ARMCortex-M4 32b MCUFPU,up to 64KB Flash,16KB SRAM, 2 ADCs,3 DACs,3 comp.,op-amp, 217ps 10-ch (HRTIM1)
PDF  115 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F334X4 Datasheet(HTML) 100 Page - STMicroelectronics

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Electrical characteristics
STM32F334x4 STM32F334x6 STM32F334x8
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DocID025409 Rev 5
6.3.23
Temperature sensor (TS) characteristics
6.3.24
VBAT monitoring characteristics
Table 72. Temperature sensor (TS) characteristics
Symbol
Parameter
Min.
Typ.
Max.
Unit
TL(1)
1. Guaranteed by design, not tested in production.
VSENSE linearity with temperature
-
±1
±2°C
Avg_Slope(1) Average slope
4.0
4.3
4.6
mV/°C
V25
Voltage at 25 °C
1.34
1.43
1.52
V
tSTART(1)
Startup time
4
-
10
µs
TS_temp(1)(2)
2. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the
temperature
2.2
-
-
µs
Table 73. Temperature sensor (TS) calibration values
Calibration value name
Description
Memory address
TS_CAL1
TS ADC raw data acquired at
temperature of 30 °C,
VDDA= 3.3 V
0x1FFF F7B8 - 0x1FFF F7B9
TS_CAL2
TS ADC raw data acquired at
temperature of 110 °C
VDDA= 3.3 V
0x1FFF F7C2 - 0x1FFF F7C3
Table 74. VBAT monitoring characteristics
Symbol
Parameter
Min.
Typ.
Max.
Unit
R
Resistor bridge for VBAT
-50
-
K
Ω
QRatio on VBAT measurement
-
2
-
-
Er(1)
1. Guaranteed by design, not tested in production.
Error on Q
-1
-
+1
%
TS_vbat(1)(2)
2. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the VBAT
1mV accuracy
2.2
-
-
µs



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