BQ76PL536APAPR datasheet(49/74 Pages) TI1

49 / 74 page

bq76PL536A

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SLUSAD3B – JUNE 2011 – REVISED JANUARY 2016

7.6.22 TEST_SELECT Register (0x3d)

The TEST_SELECT places the SPI port in a special mode useful for debug.

TSEL (b7–b0) is used to place the SPI_H interface pins in a mode to support test/debug of a string of

bq76PL536A devices. 0 = normal operating mode.

When the sequence 0xa4, 0x25 ("JR") is written on subsequent write cycles, the device enters a special TEST

mode useful for stack debugging. Writes to other registers between the required sequence bytes results in the

partial sequence being voided; the entire sequence must be written again. POR, RESET, or writing a 0x00 to this

In this state, SPI pin SCLK and SDI become outputs and are enabled, and reflect the state of the SCLK_S,

SDI_S pins of the device. SDO remains an output. This allows observation of bus traffic mid-string. The lowest

device in the string should not be set to operate in this mode.

CAUTION

The user is cautioned to condition the connection to a mid- or top-string device with

suitable isolation circuitry to prevent injury or damage to connected devices.

Programming the most-negative device on the stack in this mode prevents further

communications with the stack until POR, and may result in device destruction; this

condition should be avoided.

Figure 45. TEST_SELECT Register

TSEL[7]

TSEL[6]

TSEL[5]

TSEL[4]

TSEL[3]

TSEL[2]

TSEL[1]

TSEL[0]

7.6.23 E_EN Register (0x3f)

The E_EN register controls the access to the programming of the integrated OTP EPROM.

This register should be written the value 0x91 to permit writing the USER block of EPROM. Values other than

0x00 and 0x91 are reserved and may result in undefined operation. The next read or write of any type to the

device resets (closes) the write window. If a Group3 protected write occurs, the window is closed after the write.

Figure 46. E_EN Register

E_EN[7]

E_EN[6]

E_EN[5]

E_EN[4]

E_EN[3]

E_EN[2]

E_EN[1]

E_EN[0]

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