AN3169 datasheet(5/12 Pages) STMICROELECTRONICS

No. de pieza	AN3169

Descripción Electrónicos	Technology performance comparison of Triacs subjected to fast transient voltages

PDF	12 Pages

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Fabricante Electrónico	STMICROELECTRONICS [STMicroelectronics]

Página de inicio	http://www.st.com

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5 / 12 page

AN3169

Triac technologies and immunity

Doc ID 17194 Rev 1

5/12

Table 1.

Measured IGT and dV/dt parameters of tested samples

(1)

IGT is measured with standard 30 Ω / 12 V circuit and dV/dt with standard test circuit: open gate and

400 V applied peak voltage

P/N

Techno.

Sample

Igt (mA)

dV/dt (V/µs) 125 °C

Positive

Negative

Z0409N

Top

1.02

3.37

4.69

118

0.90

2.90

3.49

140

135

1.02

2.99

4.08

120

0.98

2.72

3.69

160

138

T410-800

Mesa

1.57

5.82

3.43

200

450

1.67

7.14

3.69

180

710

1.52

5.43

3.31

180

525

1.65

6.99

3.64

170

630

ACST2

Planar

3.54

6.20

6.83

>5000

3.48

6.20

6.82

>5000

3.45

6.20

6.83

>5000

3.47

6.20

6.73

>5000

COMP.1A

Planar

4.89

4.05

5.10

500

470

4.85

4.28

5.22

580

500

4.86

4.05

5.05

530

430

4.85

4.16

5.34

540

560

COMP.2A

Planar

5.27

6.25

5.65

>5000

4.57

4.36

4.27

>5000

3.81

3.39

3.09

>5000

4.82

4.68

4.49

>5000

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