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AS1109 Datasheet(PDF) 17 Page - ams AG |
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AS1109 Datasheet(HTML) 17 Page - ams AG |
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17 / 26 page ![]() www.austriamicrosystems.com Revision 1.18 17 - 26 AS1109 Data Sheet - A p p l i c a t i o n I n f o r m a t i o n 9 Application Information Error Detection The AS1109 features two types of error detection. The error detection can be used on-the-fly, for active LEDs, without any delay, or by entering into low-current diagnosis mode. Error Detection On-The-Fly Error detection on-the-fly will output the status of active LEDs during operation. Without choosing an error mode this will output the temperature flag at every input/output cycle. Triggering one clock pulse for open or two clock pulses for short detection during error detection mode outputs the detailed open- or short-error report with the next input/output cycle (see Figure 20). LEDs that are turned off cannot be tested and their digits at the error output must be ignored. Figure 20. Normal Operation with Error Detection During Operation – 128 Cascaded AS1109s Error Detection with Low-Current Diagnosis Mode This unique feature of the AS1109 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error detection mode can be started anytime, and does not require any SDI input (see Figure 21). Figure 21. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 128 Cascaded AS1109s Display SDI SDO CLK OEN LD Current Data1 Data2 Data3 T/O or S Error Code Data1 T/O or S Error Code Data0 T/O or S Error Code Data2 1024x 1024x 1024x Clock for Error Mode 0x/1x/2x Rising Edge of OEN Acquisition of Error Status Falling Edge of LD; Error Register is copied into Shift Register ≤ 100mA GEF GEF GEF = Global Error Flag Falling Edge of LD; Error Register is copied into Shift Register Clock for Error Mode 0x/1x/2x Rising Edge of OEN Acquisition of Error Status Data2 Data3 Data4 GEF 1024x 1024x Data0 Data1 Rising Edge of OEN Acquisition of Error Status Falling Edge of LD; Error Register is copied into Shift Register GEF O or S Error Code of All 1s Test Patern Temperature Error Code Load Internal All 1s Test Pattern ≤ 100mA ≤ 100mA 2µs Low-Current Diagnosis Mode 3x Clocks Low- Current Mode Clock for Error Mode 1x/2x Display SDI SDO CLK OEN LD Current ≤ 0.8mA GEF = Global Error Flag Data1 Data2 |
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