© IMP, Inc.

IMP8980D DS-5-00

8

‡ Typical figures are at 25

°C and are for design aid only: not guaranteed and not subject to production testing.

* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.

Absolute Maximum Ratings*

Parameter

Symbol

Min

Max

Units

1

-0.3

7

V

2

Voltage on Digital Inputs

V

3

Voltage on Digital Outputs

V

4

Current at Digital Outputs

40

mA

5

Storage Temperature

-65

+150

°C

6

Package Power Dissipation

2

W

Characteristics

Sym

Min

Max

Units

Test Conditions

1

Operating Temperature

-40

+85

°C

2

Positive Supply

4.75

5.25

V

3

Input Voltage

0

VDD

V

‡ Typical figures are at 25

°C and are for design aid only: not guaranteed and not subject to production testing.

Characteristics

Sym

Min

Max

Units

Test Conditions

1

Supply Current

6

10

mA

Outputs unloaded

2

Input High Voltage

2.0

V

3

Input Low Voltage

0.8

V

4

Input Leakage

5

µA

5

Input Pin Capacitance

8

pF

Outputs

Inputs

6

Output High Voltage

2.4

V

7

Output High Current

10

15

mA

8

Output Low Voltage

0.4

V

9

Output Low Current

5

10

mA

10

High Imp. Leakage

5

µA

11

Output Pin Capacitance

8

pF

Test Point

Output

Pin

C

L

V

SS

S

1

R

L

V

DD

S

2

V

SS

S1 is open circuit except

when testing output levels

or high impedance states.

S2 is switched to VDD or

VSS when testing output

levels or high impedance

states.

Figure 11 Output Load Test