PPC5604BAMLL4R datasheet(62/109 Pages) NXP

62 / 109 page

MPC5604B/C Microcontroller Data Sheet, Rev. 15

Package pinouts and signal descriptions

NXP Semiconductors

2.20.1

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical application

environment and simplified MCU software. It should be noted that good EMC performance is highly

dependent on the user application and the software in particular.

Therefore it is recommended that the user apply EMC software optimization and prequalification tests in

relation with the EMC level requested for his application.

•

Software recommendations: The software flowchart must include the management of runaway

conditions such as:

— Corrupted program counter

— Unexpected reset

— Critical data corruption (control registers...)

•

Prequalification trials: Most of the common failures (unexpected reset and program counter

corruption) can be reproduced by manually forcing a low state on the reset pin or the oscillator pins

for 1 second.

To complete these trials, ESD stress can be applied directly on the device. When unexpected

behavior is detected, the software can be hardened to prevent unrecoverable errors occurring.

2.20.2

Electromagnetic interference (EMI)

The product is monitored in terms of emission based on a typical application. This emission test conforms

to the IEC 61967-1 standard, which specifies the general conditions for EMI measurements.

2.20.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed

in order to determine its performance in terms of electrical sensitivity.

Table 33. EMI radiated emission measurement1,2

1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4

2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your

local marketing representative.

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

—

SR — Scan range

—

0.150

—

1000 MHz

fCPU SR — Operating frequency

—

MHz

VDD_LV SR — LV operating voltages

—

1.28

—

SEMI CC T Peak level

VDD = 5V, TA =25°C,

LQFP144 package

Test conforming to IEC 61967-2,

fOSC = 8 MHz/fCPU = 64 MHz

No PLL frequency

modulation

—

dBµV

±2% PLL frequency

modulation

—

dBµV

PPC5604BAMLL4R Datasheet(PDF) 62 Page - NXP Semiconductors

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