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STM32G47PBY3XXX Datasheet(PDF) 30 Page - STMicroelectronics |
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STM32G47PBY3XXX Datasheet(HTML) 30 Page - STMicroelectronics |
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30 / 229 page ![]() Functional overview STM32G473xB STM32G473xC STM32G473xE 30/229 DS12712 Rev 3 3.18 Analog-to-digital converter (ADC) The device embeds five successive approximation analog-to-digital converters with the following features: • 12-bit native resolution, with built-in calibration • 4 Msps maximum conversion rate with full resolution – Down to 41.67 ns sampling time – Increased conversion rate for lower resolution (up to 6.66 Msps for 6-bit resolution) • One external reference pin is available on all packages, allowing the input voltage range to be independent from the power supply • Single-ended and differential mode inputs • Low-power design – Capable of low-current operation at low conversion rate (consumption decreases linearly with speed) – Dual clock domain architecture: ADC speed independent from CPU frequency • Highly versatile digital interface – Single-shot or continuous/discontinuous sequencer-based scan mode: 2 groups of analog signals conversions can be programmed to differentiate background and high-priority real-time conversions – Each ADC support multiple trigger inputs for synchronization with on-chip timers and external signals – Results stored into a data register or in RAM with DMA controller support – Data pre-processing: left/right alignment and per channel offset compensation – Built-in oversampling unit for enhanced SNR – Channel-wise programmable sampling time – Analog watchdog for automatic voltage monitoring, generating interrupts and trigger for selected timers – Hardware assistant to prepare the context of the injected channels to allow fast context switching – Flexible sample time control – Hardware gain and offset compensation 3.18.1 Temperature sensor The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature. The temperature sensor is internally connected to the ADCs input channels which is used to convert the sensor output voltage into a digital value. The sensor provides good linearity but it has to be calibrated to obtain good overall accuracy of the temperature measurement. As the offset of the temperature sensor varies from chip to chip due to process variation, the uncalibrated internal temperature sensor is suitable for applications that detect temperature changes only. To improve the accuracy of the temperature sensor measurement, each device is individually factory-calibrated by ST. The temperature sensor factory calibration data are stored by ST in the system memory area, accessible in read-only mode. |
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