12 Device and Documentation Support

12.1 Device Support

12.1.1 Development Support

Texas Instruments, precision lab videos

12.2 Documentation Support

12.2.1 Related Documentation

For related documentation see the following:

• Texas Instruments, OPA2834 50-MHz, 170-μA, Negative-Rail In, Rail-to-Rail Out, Voltage-Feedback Amplifier

data sheet

• Texas Instruments, ADS7042 Ultra-Low Power, Ultra-Small Size, 12-Bit, 1-MSPS, SAR ADC data sheet

• Texas Instruments, Ultrasonic Sensing Subsystem Reference Design For Gas Flow Measurement design

guide

• Texas Instruments, OPAx836 Very-Low-Power, Rail-to-Rail Out, Negative Rail In, Voltage-Feedback

Operational Amplifiers data sheet

• Texas Instruments, Filter Design in Thirty Seconds application report

12.3 Related Links

The table below lists quick access links. Categories include technical documents, support and community

resources, tools and software, and quick access to order now.

12.4 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper

right corner, click on Alert me to register and receive a weekly digest of any product information that has

changed. For change details, review the revision history included in any revised document.

12.4.1 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

12.5 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight

from the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do

not necessarily reflect TI's views; see TI's Terms of Use.

12.6 Trademarks

All other trademarks are the property of their respective owners.

12.7 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

12.8 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

www.ti.com

OPA607, OPA2607

SBOS981F – OCTOBER 2019 – REVISED SEPTEMBER 2020

Copyright © 2020 Texas Instruments Incorporated

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Product Folder Links: OPA607 OPA2607