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VSC8504-02 Datasheet(PDF) 49 Page - Microsemi Corporation |
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VSC8504-02 Datasheet(HTML) 49 Page - Microsemi Corporation |
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49 / 131 page ![]() Functional Descriptions VMDS-10507 VSC8504-02 Datasheet Revision 4.2 38 Figure 36 • Test Access Port and Boundary Scan Architecture After a TAP reset, the device identification register is serially connected between TDI and TDO by default. The TAP instruction register is loaded either from a shift register when a new instruction is shifted in, or, if there is no new instruction in the shift register, a default value of 6'b100000 (IDCODE) is loaded. Using this method, there is always a valid code in the instruction register, and the problem of toggling instruction bits during a shift is avoided. Unused codes are mapped to the BYPASS instruction. 3.17.9 JTAG Instruction Codes The VSC8504-02 supports the following instruction codes: Table 12 • JTAG Instruction Codes Instruction Code Description BYPASS The bypass register contains a single shift-register stage and is used to provide a minimum-length serial path (one TCK clock period) between TDI and TDO to bypass the device when no test operation is required. CLAMP Allows the state of the signals driven from the component pins to be determined from the boundary scan register while the bypass register is selected as the serial path between TDI and TDO. While the CLAMP instruction is selected, the signals driven from the component pins do not change. EXTEST Allows tests of the off-chip circuitry and board-level interconnections by sampling input pins and loading data onto output pins. Outputs are driven by the contents of the boundary scan cells, which have to be updated with valid values, with the PRELOAD instruction, prior to the EXTEST instruction. Boundary Scan Register Test Access Port Controller Control Select TDO Enable TDI TMS NTRST TCK Control MUX, DFF TDO Instruction Register, Instruction Decode Control Bypass Register Device Identification Register |
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