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AN4671 Datasheet(PDF) 13 Page - STMicroelectronics

No. de pieza AN4671
Descripción Electrónicos  How to fine tune your SiC MOSFET gate driver to minimize losses
PDF  17 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4671 Datasheet(HTML) 13 Page - STMicroelectronics

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AN4671
Gate driver specs and implementation
DocID027654 Rev 1
13/17
3
Gate driver specs and implementation
The following is a short list of the minimum gate driving requirements:
1.
Dv/dt transient immunity: ±50 V/ns across the entire temperature range
SiC MOSFETs are tailored to switch fast and operate at high frequencies, hence the
intrinsic device dv/dt is higher than that observed on silicon IGBTs.
2.
Minimum differential supply voltage swing: 22-28 V
SiC MOSFETs require a higher positive gate drive voltage (+20 V) and, depending on
the application, a negative OFF gate voltage in the -2 V to -6 V range. The maximum
supply voltage rating of the driver must be between 22 V and 28 V depending on
whether a negative OFF voltage is applied. Given that the gate charge required to
switch the device is low, the higher voltage swing doesn’t affect the required gate drive
power.
3.
The current capability (sink/source current) to drive the 1200 V,100
mΩ SCT30N120 is
2 A minimum across all temperatures
It is required to enable the lowest achievable switching losses as the waveforms
reported in the previous paragraph clearly show that the gate peak current is close to
2 A at maximum switching speeds (external gate resistor = 1
Ω).
The ideal SiC MOSFET gate driver therefore represents a ‘black box’ that enables the full
potential of the device. It must therefore drive the gate with a higher voltage swing and
larger current capability than common IGBT drivers.
The STGAP1S gapDRIVE™ is the preferred ST option to drive SiC MOSFETs among the
several ST solutions available: it is a galvanically isolated single gate driver with advanced
protection, configuration and diagnostic features for N-channel MOSFETs and IGBTs.
Figure 13: STGAP1S block diagram



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