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TN0873 Datasheet(PDF) 9 Page - STMicroelectronics |
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TN0873 Datasheet(HTML) 9 Page - STMicroelectronics |
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9 / 11 page ![]() DocID022757 Rev 4 9/11 TN0873 References 11 3 References • ESCC 5000 - “Generic Specification for Discrete Semiconductor Components” • ESCC 9000 - “Generic Specification for Integrated Circuits Monolithic” • ECSS-Q-ST-60-05C - “Generic procurement requirements for hybrids” • ESCC 22900 - “Basic Specification - Total Dose Steady-state Irradiation Test Method” • ESCC 2049000 - “Internal Visual Inspection of Silicon-Based Non-Microwave Integrated Circuits” • ESCC 2045000 - “Internal Visual Inspection of Discrete Non-Microwave Semiconductors” • MIL-STD-883 for monolithic integrated circuits • MIL-STD-750 for discrete semiconductors |
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