AD6650BBCZ2 datasheet(32/44 Pages) AD

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AD6650

Rev. A | Page 32 of 44

JTAG BOUNDARY SCAN

The AD6650 supports a subset of the IEEE Standard 1149.1

specification. For details of the standard, see the IEEE Standard

Test Access Port and Boundary-Scan Architecture, an IEEE-1149

publication.

The AD6650 has five pins associated with the JTAG interface.

These pins, listed in Table 16, are used to access the on-chip test

access port. All input JTAG pins are pull-ups except TCLK,

which is a pull-down.

Table 16. Boundary Scan Test Pins

Mnemonic

Description

TRST

Test access port reset

TCLK

Test clock

TMS

Test access port mode select

TDI

Test data input

TDO

Test data output

The AD6650 supports three op codes, listed in Table 17. These

instructions set the mode of the JTAG interface.

Table 17. Boundary Scan Op Codes

Instruction

Op Code

Bypass

Sample/Preload

Extest

A boundary scan description language (BSDL) file for this device is

available. Contact an Analog Devices sales representative for

more information.

Bypass (2'b11)

The bypass instruction allows the IC to remain in normal

functional mode and selects a 1-bit bypass register between TDI

and TDO. During this instruction, serial data is transferred

from TDI to TDO without affecting operation of the IC.

Sample/Preload (2'b01)

The sample/preload instruction allows the IC to remain in

normal functional mode and selects the boundary scan register

to be connected between TDI and TDO. The boundary scan

the functional data entering and leaving the IC. Also, test data

can be preloaded into the boundary-scan register before an

extest instruction.

Extest (2'b00)

The extest instruction places the IC into an external boundary-

test mode and selects which boundary scan register is connected

between TDI and TDO. During this operation, the boundary

scan register is accessed to drive test data off-chip via boundary

outputs and receive test data off-chip from boundary inputs.

AD6650BBCZ2 Datasheet(PDF) 32 Page - Analog Devices

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