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SPC56AP54X Datasheet(PDF) 57 Page - STMicroelectronics |
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SPC56AP54X Datasheet(HTML) 57 Page - STMicroelectronics |
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57 / 104 page ![]() SPC56xP54x, SPC56xP60x Electrical characteristics Doc ID 18340 Rev 3 57/104 RJC is device related and cannot be influenced by the user. The user controls the thermal environment to change the case to ambient thermal resistance, RCA. For instance, the user can change the size of the heat sink, the air flow around the device, the interface material, the mounting arrangement on printed circuit board, or change the thermal dissipation on the printed circuit board surrounding the device. To determine the junction temperature of the device in the application when heat sinks are not used, the Thermal Characterization Parameter ( JT) can be used to determine the junction temperature with a measurement of the temperature at the top center of the package case using Equation 3: Equation 3 TJ = TT + (JT × PD) where: TT = thermocouple temperature on top of the package (°C) JT = thermal characterization parameter (°C/W) PD = power dissipation in the package (W) The thermal characterization parameter is measured per JESD51-2 specification using a 40 gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and over about 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire. References Semiconductor Equipment and Materials International 3081 Zanker Road San Jose, CA 95134 U.S.A. (408) 943-6900 MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering Documents at 800-854-7179 or 303-397-7956. JEDEC specifications are available on the WEB at http://www.jedec.org. 1. C.E. Triplett and B. Joiner, An Experimental Characterization of a 272 PBGA Within an Automotive Engine Controller Module, Proceedings of SemiTherm, San Diego, 1998, pp. 47-54. 2. G. Kromann, S. Shidore, and S. Addison, Thermal Modeling of a PBGA for Air-Cooled Applications, Electronic Packaging and Production, pp. 53-58, March 1998. 3. B. Joiner and V. Adams, Measurement and Simulation of Junction to Board Thermal Resistance and Its Application in Thermal Modeling, Proceedings of SemiTherm, San Diego, 1999, pp. 212-220. |
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