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IP4365CX11/P Datasheet(PDF) 5 Page - NXP Semiconductors

No. de pieza IP4365CX11/P
Descripción Electrónicos  Integrated (U)SIM card passive filter array and USB full speed ESD protection to IEC 61000-4-2 level 4
PDF  12 Pages
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Fabricante Electrónico  NXP [NXP Semiconductors]
Página de inicio  http://www.nxp.com
Logo NXP - NXP Semiconductors

IP4365CX11/P Datasheet(HTML) 5 Page - NXP Semiconductors

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IP4365CX11_1
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 01 — 26 March 2010
5 of 12
NXP Semiconductors
IP4365CX11
Integrated SIM card passive filter array and USB ESD protection
7.2 Insertion loss
The IP4365CX11 is mainly designed as an EMI/RFI filter for SIM card interfaces.
The insertion loss measurement configuration of a typical 50
Ω NetWork Analyzer (NWA)
system for evaluation of the IP4365CX11 is shown in Figure 4.
The insertion loss in a 50
Ω NWA system for all three resistor equipped channels of
IP4365CX11 is depicted in Figure 5. The insertion loss is measured with a test
Printed-Circuit Board (PCB) utilizing laser drilled micro-via holes that connect the PCB
ground plane to the ground pins.
Fig 4.
Frequency response measurement configuration
(1) Channel B1 to B3.
(2) Channel C1 to C3.
(3) Channel A1 to A3.
Fig 5.
Measured insertion loss magnitudes
OUT
001aai755
50
Ω
50
Ω
Vgen
DUT
IN
TEST BOARD
008aaa214
f (MHz)
10−1
103
104
102
110
−20
−30
−10
0
s21
(dB)
−40
(1)
(3)
(2)



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