HCC40181B datasheet(6/12 Pages) STMICROELECTRONICS

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Table 3 : AC Test Setup Reference (active-low data).

AC Paths

D C Data Inputs

Test

Delay Times

Inputs

Outputs

to VSS

to V DD

Mo de*

SUM IN to SUMOUT

Any F

B1, B2, B3,

M, Cn

All A’s

ADD

SUM IN to P

A1, A2, A3,

M, Cn

All B’s

ADD

SUM IN to G

All A’s

M, Cn

B1, B2, B3

ADD

SUM IN to Cn+ 4

Cn+4

All A’s,

M, Cn

B1, B2, B3

ADD

C n to SUMOUT

Any F

All A’s,

All B’s

ADD

C n to C n+ 4

Cn+ 4

All A’s,

All B’s

ADD

SUM IN to A = B

A = B

All A’s

B1, B2, B3,

SUBTRACT

SUM IN to SUMOUT

(logic mode)

All B’s

Any F

All A’s,

EXCLUSIVE

* ADD Mode : S0, S3 = VDD ;S1, S2 = VSS. SUBTRACT Mode : S0, S3 = VSS ; S1, S2 = VDD.

DYNAMIC ELECTRICAL CHARACTERISTICS (T amb =25°C, CL = 50pF, RL = 200kΩ,

typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall time = 20ns)

Test Conditions

Val ue

Symbol

Parameter

V DD (V) Min.

Typ.

Max.

Unit

t PLH,

t PHL

Propagation Delay Time

A or B to F (logic mode)

A orBto G orP

5400

800

160

320

120

240

Aor B to F,

C n+ 4 ,or A = B

300

1000

200

400

140

280

C n to F

320

640

135

270

100

200

C n to C n+ 4

5200

400

100

200

140

t TLH,

t THL

Transition Time

100

200

100

HCC/HCF40181B

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