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ADA4356ABCZ Datasheet(PDF) 40 Page - Analog Devices

No. de pieza ADA4356ABCZ
Descripción Electrónicos  Programmable Transimpedance, Current to Bits Receiver μModule
PDF  61 Pages
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Fabricante Electrónico  AD [Analog Devices]
Página de inicio  http://www.analog.com
Logo AD - Analog Devices

ADA4356ABCZ Datasheet(HTML) 40 Page - Analog Devices

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Data Sheet
ADA4356
analog.com
Rev. 0
40 of 61
100MHz LPF cutoff frequency provides the higher bandwidth needed for narrow pulse widths that are required for
closely spaced event detection necessary for datacenter applications. Additional noise floor reduction is possible
via real-time averaging.
Clocks
For optimum performance, drive the ADC sample clock inputs, CLKP (F11) and CLKN (E11), with a differential signal.
The clock signal is typically AC-coupled into the CLKP and CLKN balls via a transformer or capacitors. These balls are
biased internally (see Figure 75) and require no external bias.
Clock Input Options
The ADA4356 has a flexible clock input structure. The clock input can be a CMOS, LVDS, low-voltage positive emitter
coupled logic (LVPECL), or sine wave signal. Regardless of the type of signal used, clock source jitter is an important
consideration, as described in the Jitter Considerations section.
Figure 85 and Figure 86 show two preferred methods for clocking the ADA4356 (at clock rates up to 1GHz prior to the
internal clock divider). A low jitter clock source is converted from a single-ended signal to a differential signal using
either an RF transformer or an RF balun.
Figure 85. Transformer-Coupled Differential Clock (up to 200MHz)
Figure 86. Balun-Coupled Differential Clock (up to 1GHz)
The RF balun configuration is recommended for clock frequencies between 125MHz and 1GHz, and the RF
transformer configuration is recommended for clock frequencies from 10MHz to 200MHz.
If a low jitter clock source is not available, another option is to AC-couple(d) a differential PECL signal to the sample
clock input balls, as shown in Figure 87. For a list of PECL drivers with excellent jitter performance that are suitable
for this application, see Table 10.
Figure 87. Differential PECL Sample Clock (up to 1GHz)
0.1µF
0.1µF
0.1µF
0.1µF
CLOCK
INPUT
50Ω
100Ω
CLKN
CLKP
ADC
Mini-Circuits®
ADT1-1WT, 1:1 Z
XFMR
0.1µF
0.1µF
0.1µF
CLOCK
INPUT
0.1µF
50Ω
CLKN
CLKP
ADC
100Ω
0.1µF
0.1µF
0.1µF
0.1µF
240Ω
240Ω
50kΩ
50kΩ
CLKN
CLKP
CLOCK
INPUT
CLOCK
INPUT
ADC
PECL DRIVER



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