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V1.0

07/05/25

Thick Film General Purpose Chip Resistors

WR12, WR08, WR06, WR04

Newark.com/multicomp-pro

Farnell.com/multicomp-pro

sg.element14.com/b/multicomp-pro

Test

Procedure / Test Method

Requirement

Resistor

0Ω

High

Temperature

Exposure

MIL-STD-202

method 108

1,000 +48/-0 hours; without load in a temperature chamber

controlled 155 ±3°C

±5%:∆R/Rmax.±(2%+0.1Ω)

±1%:∆R/Rmax.±(1%+0.1Ω)

No visible damage

<50mΩ

Bending

strength

JISC5201-1:

1998

Clause 4.33

Resistors mounted on a 90mm glass epoxy resin PCB(FR4),

bending once 3mm for 10sec, 5mm for MCWR04

±5%:∆R/Rmax.±(1%+0.05Ω)

±1%:∆R/Rmax.±(1%+0.05Ω)

No visual damaged

<50mΩ

Adhesion

JISC5201-1:

1998

Clause 4.32

Pressurizing force: 5N, Test time: 10 ±1sec.

No remarkable damage or removal of

the terminations

Short Time

Overload

(STOL)

JISC5201-1:

1998

Clause 4.13

2.5 times RCWV or max. overload voltage, for 5seconds

±5%:∆R/Rmax.±(2%+0.05Ω)

±1%:∆R/Rmax.±(1%+0.05Ω)

No visual damaged

<50mΩ

Load life in

Humidity

JISC5201-1:

1998

Clause 4.24

1000 +48/-0 hours, loaded with RCWV or Vmax in humidity

chamber controller at 40°C± 2°C and 90 to 95% relative humid-

ity, 1.5hours on and 0.5 hours off

±5%:∆R/Rmax.±(2%+0.1Ω)

±1%:∆R/Rmax.±(1%+0.1Ω)

No visual damaged

<50mΩ

Load life

(endurance)

JISC5201-1:

1998

Clause 4.25

1000 +48/-0 hours, loaded with RCWV or Vmax in chamber

controller 70±2ºC, 1.5 hours on and 0.5 hours off

±5%:∆R/Rmax.±(3%+0.1Ω)

±1%:∆R/Rmax.±(1%+0.1Ω)

No visual damaged

<50mΩ

Insulation

Resistance

JISC5201-1:

1998

Clause 4.6

Apply the maximum overload voltage (DC) for 1minute

R 10GΩ

Dielectric

Withstand

Voltage

JISC5201-1:

1998

Clause 4.7

Apply the maximum overload voltage (AC) for 1 minute

No breakdown or flashover