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L9396 Datasheet(PDF) 88 Page - STMicroelectronics

No. de pieza L9396
Descripción Electrónicos  Automotive multiple power supply IC
PDF  109 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9396 Datasheet(HTML) 88 Page - STMicroelectronics

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System functional safety implementations
L9396
88/109
DS12539 Rev 6
reconfigured as scan chains in order to be tested by an internal bist controller. Once µC sets
LOGIC BIST RUN =1 it can perform a polling on BIST_CTRL register (bit 1:0) in order to
read the status of Logic Bist Test.
"01" means BIST RUNNING
"10" BIST PASSED
"11" BIST FAILED
"00" BIST STOPPED
If BIST STATUS is "10" (or "11") the Logic Bist test is finished and passed (or failed).
Microcontroller can write LOGIC BIST RUN = 0 to exit from BIST mode at Logic Bist end
(PASSED or FAILED) but also during the test (BIST RUNNING).
Once LOGIC BIST RUN is set from 1 to 0 the logic under test and SPI registers are reset to
the default condition.
The IC does not take actions if the Logic Bist Test fails. The decision to enable/disable the
drivers and WSS is however given to the µC.
7.8.2
Analog Bist
Analog BIST is performed periodically during normal operation on the overvoltage and
undervoltage monitors of VDD, VINTA, VBST, VPREREG, VCORE, VCOREFDBK, VCC,
VCC5 and Tracking regulators and open of GNDD. In case of ABIST fail, the failing
comparator reports overvoltage or undervoltage or POR is asserted in case of GNDD open.
7.8.3
OTP check
In each power up cycle (POR transition from low to high) the content of internal OTP is
checked. Parity bits have been implemented to monitor the change of state of the trimming
bits. In case check is not completed or not passed a dedicated fault bit is set (OTP_STABLE
bit of ADV_CONFIG register).
Table 59. Logic Bist
Symbol
Parameter
Conditions/Comments
Min.
Typ.
Max.
Unit
TBIST
Duration of digital BIST
Design Information
4.8
5.15
5.5
ms



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