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AFT09MS007N Datasheet(PDF) 3 Page - NXP Semiconductors |
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AFT09MS007N Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 28 page ![]() AFT09MS007NT1 3 RF Device Data Freescale Semiconductor, Inc. Table 5. Electrical Characteristics (TA =25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD =7.5 Vdc, IDQ = 100 mA, Pin = 0.22W,f= 870 MHz Common--Source Amplifier Output Power Pout — 7.3 — W Drain Efficiency D — 71.0 — % Load Mismatch/Ruggedness (In Freescale Test Fixture, 50 ohm system) IDQ = 100 mA Frequency (MHz) Signal Type VSWR Pin (W) Test Voltage, VDD Result 870 CW > 65:1 at all Phase Angles 0.4 (3 dB Overdrive) 10.8 No Device Degradation |
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