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FSGYE230R3 Datasheet (PDF) - Intersil Corporation

FSGYE230R3 Datasheet PDF - Intersil Corporation
No. de pieza FSGYE230R3
Descarga  FSGYE230R3 Descarga
Tamaño del archivo   81.82 Kbytes
Page   8 Pages
Fabricante Electrónico  INTERSIL [Intersil Corporation]
Página de inicio  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation
Descripción Electrónicos Radiation Hardened, SEGR Resistant N-Channel Power MOSFET

FSGYE230R3 Datasheet (PDF)

Go To PDF Page Descarga Datasheet
FSGYE230R3 Datasheet PDF - Intersil Corporation

No. de pieza FSGYE230R3
Descarga  FSGYE230R3 Click to download

Tamaño del archivo   81.82 Kbytes
Page   8 Pages
Fabricante Electrónico  INTERSIL [Intersil Corporation]
Página de inicio  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation
Descripción Electrónicos Radiation Hardened, SEGR Resistant N-Channel Power MOSFET

FSGYE230R3 Datasheet (HTML) - Intersil Corporation


FSGYE230R3 Detalles de producto

Intersil Star*Power Rad Hard
MOSFETs have been specifically
developed for high performance
applications in a commercial or
military space environment.
Star*Power MOSFETs offer the system designer both
extremely low rDS(ON) and Gate Charge allowing the
development of low loss Power Subsystems. Star*Power
Gold FETs combine this electrical capability with total dose
radiation hardness up to 100K RADs while maintaining the
guaranteed performance for SEE (Single Event Effects)
which the Intersil FS families have always featured.
The Intersil family of Star*Power FETs includes a series of
devices in various voltage, current and package styles. The
portfolio consists of Star*Power and Star*Power Gold
products. Star*Power FETs are optimized for total dose and
rDS(ON) while exhibiting SEE capability at full rated voltage
up to an LET of 37. Star*Power Gold FETs have been
optimized for SEE and Gate Charge combining SEE
performance to 80% of the rated voltage for an LET of 82
with extremely low gate charge characteristics.
This MOSFET is an enhancement-mode silicon-gate power
field effect transistor of the vertical DMOS (VDMOS)
structure. It is specifically designed and processed to be
radiation tolerant. The MOSFET is well suited for
applications exposed to radiation environments such as
switching regulation, switching converters, power
distribution, motor drives and relay drivers as well as other
power control and conditioning applications. As with
conventional MOSFETs these Radiation Hardened
MOSFETs offer ease of voltage control, fast switching
speeds and ability to parallel switching devices.
Reliability screening is available as either TXV, or Space
equivalent of MIL-S-19500.
Formerly available as type TA45230W.

Features
• 12A, 200V, rDS(ON) = 0.150Ω
• UIS Rated
• Total Dose
- Meets Pre-RAD Specifications to 100K RAD (Si)
• Single Event
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 82MeV/mg/cm2 with
VDS up to 80% of Rated Breakdown and
VGS of 5V Off-Bias
• Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BVDSS
- Typically Survives 2E12 if Current Limited to IAS
• Photo Current
- 3.0nA Per-RAD (Si)/s Typically
• Neutron
- Maintain Pre-RAD Specifications
for 1E13 Neutrons/cm2
- Usable to 1E14 Neutrons/cm2




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Acerca de Intersil Corporation


Intersil Corporation era una compañía de semiconductores estadounidenses que se especializó en el diseño y fabricación de circuitos integrados analógicos y de señal mixta de alto rendimiento.
La compañía fue fundada en 1967 y era conocida por su experiencia en gestión de energía, conversión de datos y tecnologías de radiofrecuencia (RF).
Los productos de Intersil se utilizaron en una amplia gama de aplicaciones, como la electrónica de consumo, industrial, telecomunicaciones y aeroespacial y defensa.
En 2016, Intersil fue adquirido por Renesas Electronics Corporation, una empresa de semiconductores japoneses.
La marca y la tecnología Intersil continúan desarrollándose y vendiendo como parte de la cartera de productos de Renesas.

*Esta información es solo para fines informativos generales, no seremos responsables de ninguna pérdida o daño causado por la información anterior.




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