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STM32L15xRC Datasheet(PDF) 59 Page - STMicroelectronics |
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STM32L15xRC Datasheet(HTML) 59 Page - STMicroelectronics |
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59 / 136 page ![]() DocID022799 Rev 12 59/136 STM32L151xC STM32L152xC Electrical characteristics 109 6.3.3 Embedded internal reference voltage The parameters given in Table 17 are based on characterization results, unless otherwise specified. Table 16. Embedded internal reference voltage calibration values Calibration value name Description Memory address VREFINT_CAL Raw data acquired at temperature of 30 °C ±5 °C VDDA= 3 V ±10 mV 0x1FF8 00F8 - 0x1FF8 00F9 Table 17. Embedded internal reference voltage Symbol Parameter Conditions Min Typ Max Unit VREFINT out (1) Internal reference voltage – 40 °C < TJ < +110 °C 1.202 1.224 1.242 V IREFINT Internal reference current consumption -- 1.4 2.3 µA TVREFINT Internal reference startup time - - 2 3 ms VVREF_MEAS VDDA and VREF+ voltage during VREFINT factory measure -2.99 3 3.01 V AVREF_MEAS Accuracy of factory-measured VREF value(2) Including uncertainties due to ADC and VDDA/VREF+ values -- ±5 mV TCoeff(3) Temperature coefficient –40 °C < TJ < +110 °C - 25 100 ppm/° C ACoeff(3) Long-term stability 1000 hours, T= 25 °C - - 1000 ppm VDDCoeff(3) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V TS_vrefint(3) ADC sampling time when reading the internal reference voltage -4 - - µs TADC_BUF(3) (4) Startup time of reference voltage buffer for ADC -- - 10 µs IBUF_ADC(3) Consumption of reference voltage buffer for ADC - - 13.5 25 µA IVREF_OUT(3) VREF_OUT output current (5) -- - 1 µA CVREF_OUT(3) VREF_OUT output load - - - 50 pF ILPBUF(3) Consumption of reference voltage buffer for VREF_OUT and COMP - - 730 1200 nA VREFINT_DIV1(3) 1/4 reference voltage - 24 25 26 % VREFIN T VREFINT_DIV2(3) 1/2 reference voltage - 49 50 51 VREFINT_DIV3(3) 3/4 reference voltage - 74 75 76 1. Guaranteed by test in production. 2. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes. 3. Guaranteed by characterization results. 4. Shortest sampling time can be determined in the application by multiple iterations. |
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