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STD6N80K5 Datasheet(PDF) 5 Page - STMicroelectronics

No. de pieza STD6N80K5
Descripción Electrónicos  Zener-protected
PDF  26 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STD6N80K5 Datasheet(HTML) 5 Page - STMicroelectronics

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STB6N80K5, STD6N80K5, STI6N80K5, STP6N80K5
Electrical characteristics
26
.
The built-in back-to-back Zener diodes have been specifically designed to enhance the ESD
capability of the device. The Zener voltage is appropriate for efficient and cost-effective
intervention to protect the device integrity. These integrated Zener diodes thus eliminate the
need for external components.
Table 6. Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
td(on)
Turn-on delay time
VDD = 400 V, ID = 2.25 A,
RG = 4.7 Ω, VGS = 10 V
-16-
ns
tr
Rise time
-
7.5
-
ns
td(off)
Turn-off delay time
-
28.5
-
ns
tf
Fall time
-
16
-
ns
Table 7. Source drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain current
-
4.5
A
ISDM
(1)
1.
Pulse width limited by safe operating area
Source-drain current (pulsed)
-
18
A
VSD
(2)
2.
Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Forward on voltage
ISD = 4.5 A, VGS = 0
-
1.5
V
trr
Reverse recovery time
ISD = 4.5 A, VDD = 60 V
di/dt = 100 A/µs,
-
280
ns
Qrr
Reverse recovery charge
-
2.2
μC
IRRM
Reverse recovery current
-
15.5
A
trr
Reverse recovery time
ISD = 4.5 A,VDD = 60 V
di/dt =100 A/µs,
Tj = 150 °C
-
450
ns
Qrr
Reverse recovery charge
-
3.15
μC
IRRM
Reverse recovery current
-
14
A
Table 8. Gate-source Zener diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
V(BR)GSO
Gate-source breakdown voltage IGS = ± 1mA, ID = 0
30
-
-
V



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