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STS1TX Datasheet(PDF) 20 Page - STMicroelectronics

No. de pieza STS1TX
Descripción Electrónicos  Industrial monitoring and control
PDF  70 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STS1TX Datasheet(HTML) 20 Page - STMicroelectronics

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Characteristics
STS1TX
20/70
DocID025109 Rev 1
Table 13. Crystal oscillator characteristics
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
XTALF
Crystal frequency
Range 1
Range 2
24
48
26
52
MHz
FTOL
Frequency tolerance(1)
1. Including initial tolerance, crystal loading, aging, and temperature dependence. The acceptable
crystal tolerance depends on RF frequency and channel spacing/bandwidth.
± 40
ppm
PNXTAL
Minimum requirement on
external reference phase
noise mask (Fxo=26 MHz),
to avoid degradation on
synthesizer phase/noise
100 Hz
-90
dBc/Hz
1 kHz
-120
dBc/Hz
10 kHz
-135
dBc/Hz
100 kHz
-140
dBc/Hz
1 MHz
-140
dBc/Hz
TSTART
Startup time(2)
2. Startup times are crystal dependent. The crystal oscillator transconductance can be tuned to
compensate the variation of crystal oscillator series resistance.
VBAT=1.8 V, Fxo= 52
MHz
60
120
220
µs
Table 14. Ultra low power RC oscillator
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
RCF
Calibrated frequency
Calibrated RC oscillator
frequency is derived from
crystal oscillator frequency.
Digital clock domain 26 MHz
-
34.7
kHz
RCTOL
Frequency accuracy after
calibration
±1
%
Table 15. N-Fractional Σ∆ frequency synthesizer characteristics
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
FRES
Frequency resolution
Fxo = 26 MHz high band
-
33
Hz
PNSYNTH
RF carrier phase noise
(915 MHz band)
10 kHz
-100
-97
-94
dBc/Hz
100 kHz
-104
-101
-99
dBc/Hz
200 kHz
-105
-102
-100
dBc/Hz
500 kHz
-112
-110
-107
dBc/Hz
1 MHz
-120
-118
-116
dBc/Hz
2 MHz
-123
-121
-119
dBc/Hz
TOTIME
PLL turn-on/hop time
60
80
µs
CALTIME
PLL calibration time
54
µs



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