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LM9073 Datasheet(PDF) 16 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No. de pieza LM9073
Descripción Electrónicos  Dual High Current Low-Dropout System Regulator
PDF  18 Pages
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Fabricante Electrónico  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM9073 Datasheet(HTML) 16 Page - National Semiconductor (TI)

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Application Information (Continued)
Electro-Magnetic Compatibiltiy (EMC)
Systems utilizing the LM9073 will not experience loss of sup-
ply or false reset signals from the regulator when subjected
to high frequency interference from a standard Bulk Current
Injection test (ISO11452 Part 4 test method). The following
test conditions and configuration (Figure 9) can be used to
verify this performance:
•
Frequency Range
1MHz to 400MHz
•
Modulation 1
(no modulation)
•
Modulation 2
1kHz sine wave, 80% AM
•
Dwell Time
1 second
•
Frequency Steps
1MHz (from 1MHz to 10MHz)
•
2MHz (from 10MHz to 200MHz)
•
20MHz (from 200MHz to 400MHz)
•
Test Method
Closed loop current probe
In this test configuration the current injected in to either the
input pin or the tracking output pin is increased until a reset
output is generated. These two pins are the most critical as
they typically will connect to a module through long lengths
of wire most likely to pick up high frequency energy. Figure
10 illustrates examples of test results on the LM9073 with
both types of modulation.
These results are just examples as actual results in any
given application will depend on numerous external factors
such as component selection, pc board layout, etc. The cur-
rent power of the injected signal is expressed indB relative to
1mA (i.e. 40dBmA = 100mA)
Figure 9. EMC Test Circuit
DS101296-24
Figure 10. Examples of BCI Test
BCI Susceptibility, Modulation 1 (CW)
DS101296-25
BCI Susceptibility, Modulation 2 (CW)
(1kHz, 80% AM Modulation)
DS101296-26
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