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STPSC8TH13TI Datasheet(PDF) 2 Page - STMicroelectronics

No. de pieza STPSC8TH13TI
Descripción Electrónicos  Dual 650 V power Schottky silicon carbide diode in series
PDF  8 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
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STPSC8TH13TI Datasheet(HTML) 2 Page - STMicroelectronics

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Characteristics
STPSC8TH13TI
2/8
DocID024698 Rev 3
1
Characteristics
When the diodes are used simultaneously:
T
j(diode1) = P(diode1) x Rth(j-c) (per diode) + P(diode2) x Rth(c)
To evaluate the conduction losses use the following equation:
P = 1.35 x IF(AV) + 0.144 x IF
2
(RMS)
Table 2. Absolute ratings (limiting values at 25 °C unless otherwise specified, per
diode)
Symbol
Parameter
Value
Unit
VRRM
Repetitive peak reverse voltage
650
V
IF(RMS)
Forward rms current
22
A
IF(AV)
Average forward current
Tc = 85 °C
(1), DC current
1.
Value based on Rth(j-c) max (per diode)
8A
IFSM
Surge non repetitive forward
current
tp = 10 ms sinusoidal, Tc = 25 °C
tp = 10 ms sinusoidal, Tc = 125 °C
tp = 10 µs sinusoidal, Tc = 25 °C
75
69
420
A
IFRM
Repetitive peak forward current Tc = 85 °C
(1),
 = 0.1
33
A
Tstg
Storage temperature range
-55 to +175
°C
Tj
Operating junction temperature (2)
2.
condition to avoid thermal runaway for a diode on its own heatsink
-40 to +175
°C
Table 3. Thermal resistance
Symbol
Parameter
Typ.
Max.
Unit
Rth(j-c)
Junction to case
Per diode
3.5
4.3
°C/W
Total
1.95
2.35
Rth(c)
0.4
°C/W
Table 4. Static electrical characteristics (per diode)
Symbol
Parameter
Tests conditions
Min.
Typ.
Max.
Unit
IR
(1)
1. Pulse test: tp = 10 ms,  < 2%
Reverse leakage
current
Tj = 25 °C
VR = VRRM
-7
80
µA
Tj = 150 °C
-
65
335
VF
(2)
2. Pulse test: tp = 500 µs,  < 2%
Forward voltage drop
Tj = 25 °C
IF = 8 A
-
1.56
1.75
V
Tj = 150 °C
-
1.98
2.5
dPtot
dTj
---------------
1
Rth j
a

--------------------------



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