CS1124

http://onsemi.com

2

MAXIMUM RATINGS

Rating

Value

Unit

Storage Temperature Range

−65 to 150

°C

Ambient Operating Temperature

−40 to 125

°C

Supply Voltage Range (continuous)

−0.3 to 7.0

V

Input Voltage Range (at any input, R1 = R2 = 22 k)

−250 to 250

V

Maximum Junction Temperature

150

°C

ESD Susceptibility (Human Body Model)

2.0

kV

Lead Temperature Soldering:

Reflow: (SMD styles only) (Note 1)

230 peak

°C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

1. 60 second maximum above 183

°C.

Characteristic

Test Conditions

Min

Typ

Max

Unit

Operating Current Supply

−

−

5.0

mA

Sensor Inputs

Input Threshold − Positive

135

135

160

160

185

185

mV

mV

Input Threshold − Negative

−185

135

−160

160

−135

185

mV

mV

Input Bias Current (INP1, INP2)

−16

−11

−6.0

mA

Input Bias Current (DIAG)

−

−

1.0

mA

−

152

100

155

−

157

%INP

%INP

Bias Current Matching

−1.0

0

1.0

mA

Input Clamp − Negative

−0.5

−0.5

−0.25

−0.30

0

0

V

V

Input Clamp − Positive

5.0

7.0

9.0

V

Output Low Voltage

−

0.2

0.4

V

Output High Voltage

−

V

Mode Change Time Delay

−

0

−

20

ms

Input to Output Delay

−

1.0

20

ms

Output Rise Time

−

0.5

2.0

ms

Output Fall Time

−

0.05

2.0

ms

Open−Sensor Positive Threshold

29.4

54

86.9

k

W

Logic Inputs

DIAG Input Low Threshold

−

−

−

0.2

V

DIAG Input High Threshold

−

0.7

−

−

V

DIAG Input Resistance

8.0

8.0

22

22

70

70

k

W

k

W

2. This parameter is guaranteed by design, but not parametrically tested in production.