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LM140LAH-12/883 Datasheet(PDF) 3 Page - Texas Instruments

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No. de pieza LM140LAH-12/883
Descripción Electrónicos  LM140LQML Series 3-Terminal Positive Regulators
PDF  13 Pages
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Fabricante Electrónico  TI [Texas Instruments]
Página de inicio  http://www.ti.com
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LM140LAH-12/883 Datasheet(HTML) 3 Page - Texas Instruments

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LM140LQML
www.ti.com
SNVS381A – MARCH 2006 – REVISED MAY 2013
Absolute Maximum Ratings
(1)
Input Voltage
35V
Internal Power Dissipation(2)
Internally Limited
Operating Temperature Range
−55°C ≤ TA ≤ +125°C
Maximum Junction Temperature
+150°C
Storage Temperature Range
−65°C ≤ TA ≤ +150°C
Lead Temperature (Soldering, 10 sec.)
+300°C
Still Air @ 0.5W
201°C/W
θJA
Thermal Resistance
500LF / Min Air Flow @ 0.5W
79°C/W
θJC (@ 1.0W)
38°C/W
ESD Susceptibility(3)
TBD
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not specify specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
Human body model, 100pF discharged through 1.5K
Ω
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
12
Settling time at
25
13
Settling time at
125
14
Settling time at
-55
Copyright © 2006–2013, Texas Instruments Incorporated
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3
Product Folder Links: LM140LQML



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