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AN3181 Datasheet(PDF) 25 Page - STMicroelectronics

No. de pieza AN3181
Descripción Electrónicos  Guidelines for obtaining IEC 60335 Class B certification in an STM8 application
PDF  31 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3181 Datasheet(HTML) 25 Page - STMicroelectronics

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AN3181
Class B solution structure
Doc ID 17286 Rev 2
25/31
inside this range in both cases. This area differs among the devices. The user must respect
the dedicated stack area when the pattern location is changed.
Figure 14.
Stack overflow run mode test structure
4.4.4
Clock run mode self test
The current master clock frequency selected by user application is gated by LSI internal
clock source. The resulting number of pulses is compared with the initial master frequency
reference sample measure which was stored during initial run mode self tests. When there
is more than +/-25% difference found, FailSafe() routine is called. Occasional over captured
measure is ignored. It can appear when a longer user interrupt service corrupts current
measurement.
Figure 15.
Clock run mode self test structure



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