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AN2834 Datasheet(PDF) 41 Page - STMicroelectronics

No. de pieza AN2834
Descripción Electrónicos  How to get the best ADC accuracy in STM32Fx Series and STM32L1 Series devices
PDF  45 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN2834 Datasheet(HTML) 41 Page - STMicroelectronics

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AN2834
How to get the best ADC accuracy
44
3.4.4
Source of described problem - ADC design
The following sections list some possible causes for the charging of the internal sampling
capacitor Csh. This is not an exhaustive list; only the main possible sources of the ADC
design are listed.
Parasitic switch capacitance effect
The sampling switch inside ADC sampling circuit (see Figure 33) is not ideal. In reality the
sample and hold switch (S1) is designed as 2 transistors (PMOS and NMOS, see
Figure 37):
Figure 37. Implementation of sampling switch
The switch is controlled by the gate voltages of transistors (inverted signal on PMOS
transistor). This design is a standard bidirectional switch (for rail to rail range of input Uin
voltages). Both transistors have parasitic capacitances between gate and source.
If those capacitances are charged (close to the switch), then their charge can be transferred
to the sampling capacitor (see Figure 38).
Figure 38. Parasitic capacitances of sampling switch
This charging and discharging currents (PMOS and NMOS asymmetric capacitances) can
cause charge transfer to sampling capacitor Csh.
H = switch on
L = switch off
Csh
S1
Uin
ai17909
Csh
S1
Uin
Cext
i
i
L --> H switching on
ai17910



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