5-536

FAST AND LS TTL DATA

SN54/74LS377

• SN54/74LS378 • SN54/74LS379

GUARANTEED OPERATING RANGES

Symbol

Parameter

Min

Typ

Max

Unit

VCC

Supply Voltage

54

74

4.5

4.75

5.0

5.0

5.5

5.25

V

TA

Operating Ambient Temperature Range

54

74

– 55

0

25

25

125

70

°C

IOH

Output Current — High

54, 74

– 0.4

mA

IOL

Output Current — Low

54

74

4.0

8.0

mA

Symbol

Parameter

Limits

Unit

Test Conditions

Symbol

Parameter

Min

Typ

Max

Unit

Test Conditions

VIH

Input HIGH Voltage

2.0

V

Guaranteed Input HIGH Voltage for

All Inputs

VIL

Input LOW Voltage

54

0.7

V

Guaranteed Input LOW Voltage for

VIL

Input LOW Voltage

74

0.8

V

Guaranteed Input LOW Voltage for

All Inputs

VIK

Input Clamp Diode Voltage

– 0.65

– 1.5

V

VCC = MIN, IIN = – 18 mA

VOH

Output HIGH Voltage

54

2.5

3.5

V

VCC = MIN, IOH = MAX, VIN = VIH

or VIL per Truth Table

VOH

Output HIGH Voltage

74

2.7

3.5

V

VCC = MIN, IOH = MAX, VIN = VIH

or VIL per Truth Table

VOL

Output LOW Voltage

54, 74

0.25

0.4

V

IOL = 4.0 mA

VCC = VCC MIN,

VIN = VIL or VIH

per Truth Table

VOL

Output LOW Voltage

74

0.35

0.5

V

IOL = 8.0 mA

VIN = VIL or VIH

per Truth Table

IIH

Input HIGH Current

20

µA

VCC = MAX, VIN = 2.7 V

IIH

Input HIGH Current

0.1

mA

VCC = MAX, VIN = 7.0 V

IIL

Input LOW Current

– 0.4

mA

VCC = MAX, VIN = 0.4 V

IOS

Short Circuit Current (Note 1)

– 20

– 100

mA

VCC = MAX

ICC

Power Supply Current

LS377

LS378

LS379

28

22

15

mA

VCC = MAX, NOTE 1

NOTE: With all inputs open and GND applied to all data and enable inputs, ICC is measured after a momentary GND, then 4.5 V is applied to clock.

Note 1: Not more than one output should be shorted at a time, nor for more than 1 second.

Symbol

Parameter

Limits

Unit

Test Conditions

Symbol

Parameter

Min

Typ

Max

Unit

Test Conditions

fMAX

Maximum Clock Frequency

30

40

MHz

VCC = 5.0 V

CL = 15 pF

tPLH

tPHL

Propagation Delay,

Clock to Output

17

18

27

27

ns

VCC = 5.0 V

CL = 15 pF

Symbol

Parameter

Limits

Unit

Test Conditions

Symbol

Parameter

Min

Typ

Max

Unit

Test Conditions

tW

Any Pulse Width

20

ns

VCC = 5.0 V

ts

Data Setup Time

20

ns

VCC = 5.0 V

ts

Enable Setup

Inactive — State

10

ns

VCC = 5.0 V

ts

Enable Setup

Time

Active — State

25

ns

CC = 5.0 V

th

Any Hold Time

5.0

ns

DEFINITION OF TERMS

SETUP TIME (ts) — is defined as the minimum time required

for the correct logic level to be present at the logic input prior to

the clock transition from LOW-to-HIGH in order to be recog-

nized and transferred to the outputs.

HOLD TIME (th) — is defined as the minimum time following

the clock transition from LOW-to-HIGH that the logic level

must be maintained at the input in order to ensure continued

recognition. A negative HOLD TIME indicates that the correct

logic level may be released prior to the clock transition from

LOW-to-HIGH and still be recognized.