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ACST1635-8FP Datasheet(PDF) 5 Page - STMicroelectronics

No. de pieza ACST1635-8FP
Descripción Electrónicos  Characteristics
PDF  13 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ACST1635-8FP Datasheet(HTML) 5 Page - STMicroelectronics

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ACST1635-8FP
Characteristics
Doc ID 023630 Rev 1
5/13
Figure 12.
Relative variation of critical rate of
decrease of main current versus
junction temperature
Figure 13.
Relative variation of static dV/dt
immunity versus junction
temperature (typical values)
(dl / dt)c [T ] /
[T = 150 °C]
jj
(dl / dt)c
T (°C)
j
0
2
4
6
8
10
12
14
16
18
20
25
50
75
100
125
150
typical values
dV / dt [T ] /
[T = 150 °C]
jj
dV / dt
0
1
2
3
4
5
6
7
25
50
75
100
125
150
(dV/dt) > 5 KV/µs @ 150 °C
exceeding
measurements capabilities
V = V = 536 V
DR
T (°C)
j
Figure 14.
Relative variation of the maximal
clamping voltage versus junction
temperature (minimum value)
Figure 15.
Relative variation of Leakage
current versus junction
temperature
0.85
0.90
0.95
1.00
1.05
1.10
1.15
-50
-25
0
25
50
75
100
125
150
V [T /V [T = 25 °C]
CL
j
CL
j
T (°C)
j
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
1.0E+00
25
50
75
100
125
150
T (°C)
j
V
= V
= 400 V
DRM
RRM
V
= V
= 600 V
DRM
RRM
V
= V
= 800 V
DRM
RRM
*B = Leakage current (IDRM = IRRM) at T = 150 °C, VDRM =VRRM = 800 V
j
*A = Leakage current (IDRM = IRRM) at indicated TJ and VDRM =VRRM
Relative leakage current A/B*



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