AM27C4096-100DC datasheet(9/12 Pages) AMD

No. de pieza	AM27C4096-100DC

Descripción Electrónicos	4 Megabit (256 K x 16-Bit) CMOS EPROM

PDF	12 Pages

Scroll/Zoom	100%

Fabricante Electrónico	AMD [Advanced Micro Devices]

Página de inicio	http://www.amd.com

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Am27C4096

TEST CONDITIONS

Table 1.

Test Specifications

SWITCHING TEST WAVEFORM

KEY TO SWITCHING WAVEFORMS

2.7 k

Ω

6.2 k

Ω

5.0 V

Device

Under

Test

11408F-7

Figure 3.

Test Setup

Note:

Diodes are IN3064 or equivalents.

Test Condition

All

Unit

Output Load

1 TTL gate

Output Load Capacitance, CL

(including jig capacitance)

100

Input Rise and Fall Times

≤ 20

Input Pulse Levels

0.45–2.4

Input timing measurement reference

levels

0.8, 2.0

Output timing measurement

reference levels

0.8, 2.0

2.4 V

0.45 V

Input

Output

Test Points

2.0 V

0.8 V

11408F-8

Note: For CL = 100 pF.

KS000010-PAL

WAVEFORM

INPUTS

OUTPUTS

Steady

Changing from H to L

Changing from L to H

Don’t Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High Z)

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