Radiation hardness assurance

2N2907AHR

10/21

DocID15382 Rev 6

ESCC radiation assurance

Each product lot is tested according to the ESCC basic specification 22900, with a minimum

of 11 samples per diffusion lot and 5 samples per wafer, one sample being kept as

unirradiated sample, all of them being fully compliant with the applicable ESCC generic

and/or detailed specification.

ST goes beyond the ESCC specification by performing the following procedure:

–

Test of 11 pieces by wafer, 5 biased at least 80% of V

(BR)CEO

, 5 unbiased and 1

kept for reference

–

Irradiation at 0.1 rad (Si)/s

–

Acceptance criteria of each individual wafer if as 100 krad guaranteed if all 10

samples comply with the post radiation electrical characteristics provided in

Table 8.

Delivery together with the parts of the radiation verification test (RVT) report of the particular

wafer used to manufacture the products. This RVT includes the value of each parameter at

30, 50, 70 and 100 krad (Si) and after 24 hour annealing at room temperature and after an

additional 168 hour annealing at 100°C.

Table 7. Radiation summary

Radiation test

100 krad “SW”

100 krad ESCC

Wafer test

each

each

Part tested

5 biased

5 biased + 5 unbiased

Dose rate

0.1 rad/s

0.1 rad/s

Acceptance

Fixed values

(1)

1.

Part numbers with suffix "SW" have same pre and post irradiation electrical characteristics.

Part number with suffix "SW35" have specific post irradiation electrical characteristics.

MIL-STD-750 method 1019

Displacement damage

Optional

Optional

Agency part number (ex)

5202/001/04

(2)

2.

Example of the 2N2907A in LCC-3 Gold finish.

5202/001/04R

(2)

ST part number (ex)

SOC2N2907ASW35

(1)

SOC2N2907ARHRG

Documents

CoC + RVT

CoC + RVT