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BUF04GS Datasheet(PDF) 4 Page - Analog Devices

No. de pieza BUF04GS
Descripción Electrónicos  Closed-Loop High Speed Buffer
PDF  16 Pages
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BUF04GS Datasheet(HTML) 4 Page - Analog Devices

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BUF04
REV. 0
–4–
WAFER TEST LIMITS
Parameter
Symbol
Conditions
Limit
Units
Offset Voltage
VOS
VS =
±15 V
1
mV max
VOS
VS =
±5 V
2
mV max
Input Bias Current
IB
VCM = 0 V
5
µA max
Power Supply Rejection Ratio
PSRR
V =
±4.5 V to ±18 V
76
dB
Output Voltage Range
VO
RL = 150
Ω±10.5
V min
Supply Current
ISY
VO = 0 V, RL = 2 kΩ
8.5
mA max
Gain
AVCL
VO =
±10 V, R
L = 2 k
Ω
1
± 0.005
V/V
NOTE
Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard
product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
ABSOLUTE MAXIMUM RATINGS
1
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±18 V
Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±18 V
Maximum Power Dissipation . . . . . . . . . . . . . . . See Figure 16
Storage Temperature Range
Z Package . . . . . . . . . . . . . . . . . . . . . . . . . –65
°C to +175°C
P, S Package . . . . . . . . . . . . . . . . . . . . . . . –65
°C to +150°C
Operating Temperature Range
BUF04Z . . . . . . . . . . . . . . . . . . . . . . . . . . –55
°C to +125°C
BUF04S, P . . . . . . . . . . . . . . . . . . . . . . . . . –40
°C to +85°C
Junction Temperature Range
Z Package . . . . . . . . . . . . . . . . . . . . . . . . . –65
°C to +150°C
P, S Package . . . . . . . . . . . . . . . . . . . . . . . –65
°C to +150°C
Lead Temperature Range (Soldering 60 sec) . . . . . . . . +300
°C
Package Type
θ
JA
2
θ
JC
Units
8-Pin Cerdip (Z)
148
16
°C/W
8-Pin Plastic DIP (P)
103
43
°C/W
8-Pin SOIC (S)
158
43
°C/W
NOTES
1Absolute maximum ratings apply to both DICE and packaged parts, unless
otherwise noted.
2
θ
JA is specified for the worst case conditions, i.e., θJA is specified for device in socket
for cerdip, P-DIP, and LCC packages;
θ
JA is specified for device soldered in circuit
board for SOIC package.
ORDERING GUIDE
Temperature
Package
Package
Model
Range
Description
Option
BUF04AZ/883
–55
°C to +125°C
Cerdip
Q-8
BUF04GP
–40
°C to +85°C
Plastic DIP
N-8
BUF04GS
–40
°C to +85°C
SO
SO-8
BUF04GBC
+25
°C
DICE
DICE
DICE CHARACTERISTICS
BUF04 Die Size 0.075 x 0.064 inch, 5,280 Sq. Mils
Substrate (Die Backside) Is Connected to V+
Transistor Count 45.
(@ VS =
15.0 V, TA = +25 C unless otherwise noted)



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