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ICS841S012DI Datasheet(PDF) 8 Page - Integrated Device Technology |
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ICS841S012DI Datasheet(HTML) 8 Page - Integrated Device Technology |
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8 / 22 page ![]() ICS841S012DKI REVISION A JULY 20, 2009 8 ©2009 Integrated Device Technology, Inc. ICS841S012DI Data Sheet CRYSTAL-TO-0.7V DIFFERENTIAL HCSL/LVCMOS FREQUENCY SYNTHESIZER RREF = 475 Ω Measurement Point 0 Ω 50 Ω 50 Ω 0 Ω Measurement Point 49.9 Ω 49.9 Ω HCSL GND 2pF 2pF 0V PARAMETER MEASUREMENT INFORMATION HCSL OUTPUT SKEW 3.3V CORE/3.3V LVCMOS OUTPUT LOAD AC TEST CIRCUIT 3.3V CORE/3.3V HCSL OUTPUT LOAD AC TEST CIRCUIT SCOPE Qx LVCMOS GND 1.65V±5% -1.65V±5% VDDA 1.65V±5% VDD VDDA tsk(o) V DDOX 2 V DDOX 2 tsk(o) Qx nQx Qy nQy Qx Qy LVCMOS OUTPUT SKEW VDD, VDDOB, VDDOC 3.3V±5% 3.3V±5% RMS PERIOD JITTER LVCMOS BANK SKEW tsk(b) V DDOX 2 V DDOX 2 Qx:Qx Qx:Qx (where X = Bank B or Bank C) VOH VREF VOL Mean Period (First edge after trigger) Reference Point (Trigger Edge) 1 σ contains 68.26% of all measurements 2 σ contains 95.4% of all measurements 3 σ contains 99.73% of all measurements 4 σ contains 99.99366% of all measurements 6 σ contains (100-1.973x10-7)% of all measurements Histogram |
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