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ACT4088 Datasheet(PDF) 3 Page - Active-Semi, Inc

No. de pieza ACT4088
Descripción Electrónicos  28V, 1.5A, 1.4MHz Step-Down DC/DC Converter in SOT23-6
PDF  11 Pages
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Fabricante Electrónico  ACTIVE-SEMI [Active-Semi, Inc]
Página de inicio  http://www.active-semi.com
Logo ACTIVE-SEMI - Active-Semi, Inc

ACT4088 Datasheet(HTML) 3 Page - Active-Semi, Inc

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ACT4088
Rev 1, 14-Feb-11
Innovative PowerTM
- 3 -
www.active-semi.com
Copyright © 2011 Active-Semi, Inc.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
VALUE
UNIT
IN Supply Voltage
-0.3 to 32
V
SW Voltage
-1 to VIN + 1
V
BST Voltage
VSW - 0.3 to VSW + 7
V
EN, FB Voltage
-0.3 to 6
V
Continuous SW Current
Internally Limited
A
Junction to Ambient Thermal Resistance (θJA)
220
°C/W
Maximum Power Dissipation
0.5
W
Operating Junction Temperature
-40 to 150
°C
Storage Temperature
-55 to 150
°C
Lead Temperature (Soldering, 10 sec)
300
°C
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Input Voltage
VIN
VOUT = 3.3V, ILOAD = 0A to 1.5A
4.5
28
V
Under Voltage Lockout Voltage
VUVLO
Input Voltage Rising
4
4.2
4.49
V
Under Voltage Lockout Hysteresis
250
mV
Feedback Voltage
VFB
4.75V ≤ VIN ≤ 20V, VCOMP = 1.5V
0.79
0.81
0.83
V
Frequency Foldback Threshold
250
mV
High-side Switch On Resistance
RONH
0.300
Low-side Switch On Resistance
RONH
15
SW Leakage
VEN = 0, VSW = 0V
1
10
µA
Current Limit
ILTM
VIN = 12V, VOUT = 5V, or
EN = G, SW = G
1.8
A
Switching Frequency
fSW
1.1
1.4
1.6
MHz
Foldback Switching Frequency
VFB = 0V, or FB = G
467
kHz
Maximum Duty Cycle
DMAX
VFB = 0.6V
92
%
Minimum On-Time
75
ns
EN Threshold Voltage
EN Rising
1.12
1.24
1.36
V
EN Hysteresis
EN Rising
100
mV
EN Internal Pull-up Current
2
µA
Supply Current in Shutdown
VEN = 0V or EN = G
15
30
µA
Supply Current in Operation
VEN = 2V, VFB = 1.0V
1
2
mA
Thermal Shutdown Temperature
160
°C
Thermal Shutdown Hysteresis
10
°C
ELECTRICAL CHARACTERISTICS
(VIN = 12V, TA = 25°C, unless otherwise specified.)
: Do not exceed these limits to prevent damage to the device. Exposure to absolute maximum rating conditions for long periods may
affect device reliability.



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