component-level test

perFormeD

stanDarD anD /es

/883

class h Qml

Element Electrical (probe)

yes

no

yes

yes

Element Visual

no

no

yes

yes

Internal Visual

no

N/A

yes

N/A

Final Electrical

no

no

yes

yes

no

no

yes

yes

SLAM™/C-SAM:

Input capacitors only

(Add’l test, not req. by H)

no

no

no

yes

Notes:

1. Standard and /ES, non-QML products, do no meet all of the requirements of

MIL-PRF-38534.

2. M/S = Active components (Microcircuit and Semiconductor Die)

3. P = Passive components

4. Not applicable to EMI filters that have no wire bonds.

Definitions:

Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534

SLAM™: Scanning Laser Acoustic Microscopy

C-SAM: C - Mode Scanning Acoustic Microscopy

Crane Aerospace & Electronics Power Solutions

Mor single and dual dc/dc converters

28 Volt input – 120 Watt

www.interpoint.com

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MOR Rev K - 20100422