STM8S207MBT3C datasheet(102/103 Pages) STMICROELECTRONICS

102 / 103 page

Revision history

STM8S207xx, STM8S208xx

102/103

Doc ID 14733 Rev 9

10-Jul-2009

cont’d

Section 10: Electrical characteristics: Added data for TBD values;

updated Table 15: Voltage characteristics and Table 18: General

operating conditions; updated VCAP specifications in Table 18 and in

Section 10.3.1: VCAP external capacitor; updated Figure 18;

replaced Figure 19; updated Table 35: RAM and hardware registers;

updated Figure 22 and Figure 35; added Figure 40: Typical

application with I2C bus and timing diagram(1).

Removed Table 56: Junction temperature range.

Added link between ordering information Figure 49 and STM8S20xx

features Table 2.

13-Apr-2010

Document status changed from “preliminary data” to “datasheet”.

Table 2: STM8S20xxx performance line features: high sink I/O for

STM8S207C8 is 16 (not 13).

Table 3: Peripheral clock gating bit assignments in CLK_PCKENR1/2

registers: updated bit positions for TIM2 and TIM3.

Figure 5: LQFP 48-pin pinout: added CAN_TX and CAN_RX to pins

35 and 36; noted that these pins are available only in STM8S208xx

devices.

Figure 7: LQFP 32-pin pinout: replaced uart2 with uart3.

Table 6: Pin description: added footnotes concerning beCAN

availability and UART1_RX and UART3_RX pins.

Table 13: Option byte description: added description of STM8L

bootloader option bytes to the option byte description table.

Added Section 9: Unique ID (and listed this attribute in Features).

Section 10.3: Operating conditions: added introductory text.

Table 18: General operating conditions: replaced “CEXT” with “VCAP”

and added data for ESR and ESL; removed “low power dissipation”

condition for TA.

Table 26: Total current consumption in halt mode at VDD = 5 V, TA -40

to 85° C: replaced max value of IDD(H) at 85 °C from 30 µA to 35 µA

for the condition “Flash in powerdown mode, HSI clock after

wakeup”.

Table 33: HSI oscillator characteristics: updated the ACCHSI factory

calibrated values.

Functional EMS (electromagnetic susceptibility) and Table 47:

replaced “IEC 1000” with “IEC 61000”.

Electromagnetic interference (EMI) and Table 48: replaced “SAE

J1752/3” with “IEC 61967-2”.

Table 57: Thermal characteristics: changed the thermal resistance

junction-ambient value of LQFP32 (7x7 mm) from 59 °C/W to 60

°C/W.

Table 58.

Document revision history (continued)

Date

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STM8S207MBT3C Datasheet(PDF) 102 Page - STMicroelectronics

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