ACAS0612AT datasheet(7/8 Pages) VISHAY

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Document Number: 28770

282

Revision: 06-Nov-09

ACAS 0606 AT, ACAS 0612 AT - Precision

Vishay Beyschlag

Precision Thin Film Chip Resistor Array

Superior Moisture Resistivity

Notes

(1) The quoted IEC standards are also released as EN standards with the same number and identical contents

(2) Figures are given for arrays with equal values, design type AE

(3) Relative values are equivalent to the half of its value with ± symbol, i.e. 0.1 % is equivalent to ± 0.05 %

(4) For a single element

4.24

78 (Cab)

Damp heat,

steady state

(40 ± 2)

°C; 56 days;

(93 ± 3) % RH

± (0.25 %

R + 0.05

Ω)

4.39

67 (Cy)

Damp heat,

steady state,

accelerated

(85 ± 2) °C

(85 ± 5) % RH

U = 0.1 x

≤ 100 V;

1000 h

± (0.5 %

R + 0.05

Ω)

4.13

Short time overload (4)

U = 2.5 x

U = 2 x Umax.;

5 s

± (0.1 %

R + 0.01

Ω)

no visible damage

4.40

Electrostatic discharge

(Human body model) (4)

IEC 61340-3-1;

3 pos. + 3 neg.

(equivalent to MIL-STD-883,

Method 3015); 1000 V

± (0.5 %

R + 0.05

Ω)

4.19

14 (Na)

Rapid change of

temperature

30 min at - 55 °C and

30 min at 125 °C;

1000 cycles

± (0.25 %

R + 0.05

Ω)

no visible damage

4.18.2

58 (Td)

Resistance to soldering

heat

Reflow method 2

(IR/forced gas convention);

(260 ± 5)

°C;

(10 ± 1) s

± (0.1 %

R + 0.01

Ω)

no visible damage

4.17.2

58 (Td)

Solderability

Solder bath method;

SnPb; non-activated flux

accelerated aging 4 h/155 °C

(215 ± 3) °C; (3 ± 0.3) s

Good tinning (

≥ 95 % covered);

no visible damage

Solder bath method;

SnAgCu; non-activated flux

accelerated aging 4 h/155 °C

(235 ± 3) °C; (2 ± 0.2) s

4.32

21 (Ue3)

Shear (adhesion)

45 N

No visible damage

4.33

21 (Ue1)

Substrate bending

Depth 2 mm, 3 times

± (0.1 %

R + 0.01

Ω)

no visible damage;

no open circuit in bent position

4.35

Flammability

IEC 60695-11-5,

needle flame test; 10 s

No burning after 30 s

4.22

6 (Fc)

Vibration

Endurance by sweeping;

10 to 2000 Hz; no resonance;

amplitude

≤ 1.5 mm or

≤ 200 m/s2; 6 h

± (0.1 %

R + 0.01

Ω);

no visible damage

4.7

Voltage proof

Urms = Uins

60 ± 5 s; against ambient,

between adjacent resistors

No flashover or breakdown

TEST PROCEDURES AND REQUIREMENTS

60115-1

CLAUSE

IEC

60068-2 (1)

TEST

METHOD

TEST

PROCEDURE

REQUIREMENTS (2)

PERMISSIBLE CHANGE (

ΔR)

Stability for product types:

ACAS 0606 AT

ACAS 0612 AT

Ω to 150 kΩ

70 x R

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