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2PB710ASL/DG Datasheet(PDF) 4 Page - NXP Semiconductors |
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2PB710ASL/DG Datasheet(HTML) 4 Page - NXP Semiconductors |
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4 / 9 page ![]() 2PB710AXL_1 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 01 — 29 October 2008 4 of 9 NXP Semiconductors 2PB710ARL; 2PB710ASL 50 V, 500 mA PNP general-purpose transistors [1] Pulse test: tp ≤ 300 µs; δ≤ 0.02. 8. Test information 8.1 Quality information This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. 9. Package outline VBEsat base-emitter saturation voltage IC = −300 mA; IB = −30 mA [1] -- −1.5 V fT transition frequency VCE = −10 V; IC = −50 mA; f = 100 MHz hFE group R 120 - - MHz hFE group S 140 - - MHz Cc collector capacitance VCB = −10 V; IE =ie =0A; f=1MHz --15 pF Table 8. Characteristics …continued Tamb =25 °C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit Fig 1. Package outline SOT23 (TO-236AB) 04-11-04 Dimensions in mm 0.45 0.15 1.9 1.1 0.9 3.0 2.8 2.5 2.1 1.4 1.2 0.48 0.38 0.15 0.09 12 3 |
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