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PPC5605BECLLR Datasheet(PDF) 42 Page - Freescale Semiconductor, Inc

No. de pieza PPC5605BECLLR
Descripción Electrónicos  Microcontroller
PDF  92 Pages
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Fabricante Electrónico  FREESCALE [Freescale Semiconductor, Inc]
Página de inicio  http://www.freescale.com
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PPC5605BECLLR Datasheet(HTML) 42 Page - Freescale Semiconductor, Inc

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MPC5607B Microcontroller Data Sheet, Rev. 3
Preliminary—Subject to Change Without Notice
Electrical characteristics
Freescale Semiconductor
42
3.11.3.1
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
to each pin combination. The sample size depends on the number of supply pins in the device (3 parts
×(n+1) supply pin). This
test conforms to the AEC-Q100-002/-003/-011 standard.
3.11.3.2
Static latch-up (LU)
Two complementary static tests are required on six parts to assess the latch-up performance:
A supply overvoltage is applied to each power supply pin.
A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
3.12
Fast external crystal oscillator (4 to 16 MHz) electrical
characteristics
The device provides an oscillator/resonator driver. Figure describes a simple model of the internal oscillator driver and provides
an example of a connection for an oscillator or a resonator.
Table 30 provides the parameter description of 4 MHz to 16 MHz crystals used for the design simulations.
Table 28. ESD absolute maximum ratings1,2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Symbol
Ratings
Conditions
Class
Max value3
3 Data based on characterization results, not tested in production
Unit
VESD(HBM) Electrostatic discharge voltage
(Human Body Model)
TA = 25 °C
conforming to AEC-Q100-002
H1C
2000
V
VESD(MM) Electrostatic discharge voltage
(Machine Model)
TA = 25 °C
conforming to AEC-Q100-003
M2
200
VESD(CDM) Electrostatic discharge voltage
(Charged Device Model)
TA = 25 °C
conforming to AEC-Q100-011
C3A
500
750 (corners)
Table 29. Latch-up results
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = 125 °C
conforming to JESD 78
II level A



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