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MCP6271-E/ST Datasheet(PDF) 5 Page - Microchip Technology |
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MCP6271-E/ST Datasheet(HTML) 5 Page - Microchip Technology |
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5 / 36 page ![]() © 2008 Microchip Technology Inc. DS21810F-page 5 MCP6271/1R/2/3/4/5 1.1 Test Circuits The test circuits used for the DC and AC tests are shown in Figure 1-2 and Figure 1-3. The bypass capacitors are laid out according to the rules discussed in Section 4.7 “Supply Bypass”. FIGURE 1-2: AC and DC Test Circuit for Most Non-Inverting Gain Conditions. FIGURE 1-3: AC and DC Test Circuit for Most Inverting Gain Conditions. VDD MCP627X RG RF RN VOUT VIN VDD/2 1µF CL RL VL 0.1 µF VDD MCP627X RG RF RN VOUT VDD/2 VIN 1µF CL RL VL 0.1 µF |
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