Motor de Búsqueda de Datasheet de Componentes Electrónicos
  Spanish  ▼
ALLDATASHEET.ES

X  

LHRFSBKS2092-R2 Datasheet(PDF) 7 Page - LIGITEK electronics co., ltd.

No. de pieza LHRFSBKS2092-R2
Descripción Electrónicos  DURL COLOR LED LAMPS
PDF  7 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrónico  LIGITEK [LIGITEK electronics co., ltd.]
Página de inicio  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LHRFSBKS2092-R2 Datasheet(HTML) 7 Page - LIGITEK electronics co., ltd.

  LHRFSBKS2092-R2 Datasheet HTML 1Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 2Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 3Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 4Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 5Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 6Page - LIGITEK electronics co., ltd. LHRFSBKS2092-R2 Datasheet HTML 7Page - LIGITEK electronics co., ltd.  
Zoom Inzoom in Zoom Outzoom out
 7 / 7 page
background image
This test intended to see soldering well
performed or not.
Solderability Test
1.T.Sol=230
℃±5
2.Dwell time=5
±1sec
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solder Resistance
Test
1.T.Sol=260
℃±5
2.Dwell time= 10
±1sec.
High Temperature
High Humidity Test
Thermal Shock Test
1.Ta=105
℃±5&-40℃±5
(10min) (10min)
2.total 10 cycles
1.Ta=65
℃±5
2.RH=90 %~95%
3.t=240hrs
±2hrs
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
MIL-STD-202:103B
JIS C 7021: B-11
Reference
Standard
Description
Test Item
Test Condition
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
High Temperature
Storage Test
1.Ta=105
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test
1.Ta=-40
℃±5
2.t=1000 hrs (-24hrs, +72hrs)
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
Reliability Test:
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 6/6
LHRFSBKS2092/R2
PART NO.



Html Pages

1 2 3 4 5 6 7


Datasheet Descarga

Go To PDF Page


Enlace URL



¿ALLDATASHEET es útil para Ud.?  [ DONATE ] 

Todo acerca de Alldatasheet   |   Publicidad   |   Contáctenos   |   Política de Privacidad   |   Enlace a la hoja de datos    |   Intercambio de Enlaces   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com