The ST24/25x01 are 1K bit electrically erasable

programmable memories (EEPROM), organized

as 128 x 8 bits. They are manufactured in SGS-

THOMSON’s Hi-Endurance Advanced CMOS

technology which guarantees an endurance of one

million erase/write cycles with a data retention of

40 years. The memories operate with a power

supply value as low as 1.8V for the ST24C01R only.

Both Plastic Dual-in-Line and Plastic Small Outline

packages are available.

ard, two wire serial interface which uses a bi-direc-

tional data bus and serial clock. The memories

carry a built-in 4 bit, unique device identification

tion. This is used together with 3 chip enable inputs

(E2, E1, E0) so that up to 8 x 1K devices may be

protocol with all memory operations synchronized

by the serial clock. Read and write operations are

initiated by a START condition generated by the

bus master. The START condition is followed by a

stream of 7 bits (identification code 1010), plus one

read/write bit and terminated by an acknowledge

bit.

SDA

VSS

SCL

MODE/WC

E1

E0

VCC

E2

AI00840D

ST24x01

ST25x01

ST24C01R

1

2

3

4

8

7

6

5

Figure 2A. DIP Pin Connections

1

AI00841E

2

3

4

8

7

6

5

SDA

VSS

SCL

MODE/WC

E1

E0

VCC

E2

ST24x01

ST25x01

ST24C01R

Figure 2B. SO Pin Connections

DESCRIPTION (cont’d)

Symbol

Parameter

Value

Unit

Ambient Operating Temperature

–40 to 125

°C

Storage Temperature

–65 to 150

°C

Lead Temperature, Soldering

(SO8 package)

(PSDIP8 package)

40 sec

10 sec

215

260

°C

Input or Output Voltages

–0.6 to 6.5

V

Supply Voltage

–0.3 to 6.5

V

Electrostatic Discharge Voltage (Human Body model)

(2)

4000

V

Electrostatic Discharge Voltage (Machine model)

(3)

500

V

Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings"

may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other

conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum

Rating conditions for extended periods may affect device reliability. Refer also to the SGS-THOMSON SURE Program and other

relevant quality documents.

2. MIL-STD-883C, 3015.7 (100pF, 1500

Ω).

3. EIAJ IC-121 (Condition C) (200pF, 0

Ω).

2/16

ST24/25C01, ST24C01R, ST24/25W01