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74HC02DB Datasheet(PDF) 7 Page - Nexperia B.V. All rights reserved |
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74HC02DB Datasheet(HTML) 7 Page - Nexperia B.V. All rights reserved |
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7 / 15 page ![]() 74HC_HCT02 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved. Product data sheet Rev. 5 — 26 November 2015 7 of 15 NXP Semiconductors 74HC02; 74HCT02 Quad 2-input NOR gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Test circuit for measuring switching times Table 9. Test data Type Input Load Test VI tr, tf CL 74HC02 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT02 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
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