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HCF4086B Datasheet(PDF) 4 Page - STMicroelectronics |
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HCF4086B Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 8 page ![]() HCF4086B 4/8 DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns) (*) Typical temperature coefficient for all VDD value is 0.3 %/°C. TYPICAL APPLICATION : Two HCF4086B Connected as an 8 wide 2 input A-O-I Gate Symbol Parameter Test Condition Value (*) Unit VDD (V) Min. Typ. Max. tPHL Propagation Delay Time (DATA) 5 225 450 ns 10 90 180 15 60 120 tPLH Propagation Delay Time (DATA) 5 310 620 ns 10 125 250 15 90 180 tPHL Propagation Delay Time (INHIBIT) 5 150 300 ns 10 60 120 15 40 80 tPLH Propagation Delay Time (INHIBIT) 5 250 500 ns 10 100 200 15 70 140 tTLH tTHL Transition Time 5 100 200 ns 10 50 100 15 40 80 |
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